Damage Effects and Protection on Low-Noise Amplifiers Under High-Power Microwaves

This article investigates the impact of high-power microwaves (HPM) on low-noise amplifiers (LNA) and protective measures. It begins by discussing the predominant types of LNA, followed by an examination of experimental methodologies and advancements in understanding HPM's effects on LNA. The article systematically organizes the phenomena related to HPM interference and damage, as well as explores the mechanisms underlying these effects. Specifically, it analyzes how parameters such as pulsewidth, repetition frequency, and carrier frequency influence the damage threshold. To address existing gaps in current research, potential directions for future investigation and development are proposed. Furthermore, recent advancements in protective strategies for LNA are discussed, including limiter technologies and transistor designs specifically engineered to mitigate HPM threats. This article aims to provide valuable insights for researchers and engineers striving to enhance the resilience of LNA in high-power environments.