材料科学
外延
热膨胀
晶粒生长
退火(玻璃)
薄膜
极限抗拉强度
基质(水族馆)
粒度
转变温度
复合材料
凝聚态物理
纳米技术
超导电性
地质学
物理
图层(电子)
海洋学
作者
Xianwu Tang,Yunfei Jia,Wei Lü,Ling Hu,Xuebin Zhu,Yongjin Wang,Yan Sun
摘要
An ultra-sharp metal-to-insulate transition (MIT) of 1.24 K−1 in the epitaxial perovskite NdNiO3 thin films was derived by the chemical solution deposition on the LaAlO3 substrates. The thermal strains from shrink, grain growth, and thermal expansion coefficient misfit play a key role in the film microstructure and electrical properties. The originally theoretical in-plane compressive epitaxial strain changes into a tensile one caused by the thermal driving force. It relaxes with improved grain growth via decreased oxygen vacancies with increasing annealing temperature, while the concurrently enhanced tensile strain from the thermal expansion coefficient misfit between the films and the substrate leads to the destabilization of Ni3+ and the higher MIT temperature. Nevertheless, too much higher tensile strain gives rise to island-grain growth in the films, leading to the weak and even disappeared MIT.
科研通智能强力驱动
Strongly Powered by AbleSci AI