降级(电信)
材料科学
化学工程
纳米技术
工程物理
计算机科学
物理
工程类
电信
作者
Valentina Carpenella,Fabrizio Messina,Jessica Barichello,Fabio Matteocci,P. Postorino,C. Petrillo,A. Nucara,Danilo Dini,Claudia Fasolato
摘要
We explore the physical and chemical degradation mechanisms of methylammonium lead bromide (CH 3 NH 3 PbBr 3 ) thin films, depending on the storage conditions. We show that, under vacuum conditions, the NH 4 Pb 2 Br 5 degradation compound can be formed.
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