材料科学
薄膜
电场
欧姆接触
微观结构
铁电性
兴奋剂
泄漏(经济)
杂质
电流密度
极化(电化学)
热传导
溶胶凝胶
分析化学(期刊)
凝聚态物理
复合材料
光电子学
纳米技术
电介质
有机化学
图层(电子)
量子力学
色谱法
经济
宏观经济学
物理
化学
物理化学
作者
Jing Zhang,Jian‐Qing Dai,Guangcheng Zhang,Xin-Jian Zhu
标识
DOI:10.1016/j.ceramint.2024.05.151
摘要
BiFe1-2xZnxCoxO3 (BFZCO) thin films (x = 0%, 1%, 2%, 3%, 4%, 5%) were deposited on FTO/glass substrates by sol-gel method. We systematically investigated the effects of equal doping of (Zn, Co) on the crystal microstructure, leakage current, leakage mechanism, and ferroelectric properties of BFZCO thin films. The XRD patterns indicate that all samples matched the chalcogenide structure without any impurity phases. The BiFe0.96Zn0.02Co0.02O3 (BFZCO-2) film exhibited a large residual polarization (2Pr = 339.9 μC/cm2) at an electric field strength of approximately 2000 kV/cm. The curve of leakage current density shows that equal doping of (Zn, Co) can considerably decrease the leakage current of BFO thin films at low electric fields. Furthermore, the mechanism of leakage conduction has shifted from Ohmic conduction at low electric fields to SCLC conduction at high electric fields.
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