材料科学
兴奋剂
杂质
硼
化学物理
分子动力学
从头算
纳米晶
离子键合
扩散
密度泛函理论
结晶学
纳米技术
计算化学
离子
化学
热力学
光电子学
有机化学
物理
作者
Junnan Han,Dongke Li,Jiaming Chen,Teng Sun,Yuhao Wang,Xiaodong Pi,Wei Li,Ling Xu,Jun Xu,Kunji Chen
标识
DOI:10.1021/acs.jpcc.3c04190
摘要
Co-doping in Si nanocrystals (Si NCs) is an intriguing research topic as the co-doping mechanism at the nanoscale is considerably more complex than the bulk Si. In this study, we utilized ab initio molecular dynamics simulations to investigate the impact of phosphorus (P) and boron (B) co-doping on the properties of Si NCs in the SiO2 matrix. Our findings demonstrate that P and B impurities exhibit a tendency to aggregate within sub-interfaces and interfacial regions. Furthermore, introducing B impurities during the co-doping process facilitates bonding between P and B near the interface to form P–B pairs. The results of ionic conductivity derived from the diffusion coefficient indicate that with increasing B concentration, the conductance activation energy first decreases before increasing, implying that the introduction of B impurity leads to greater bonding of P impurity to Si or B atoms. Vibrational simulations and bonding configurations on the structure reveal that P–B pair formation weakens the intensity of the vibrational density peak due to the P–B co-doping process, thereby stabilizing the structure.
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