A Read Margin Enhancement Circuit With Dynamic Bias Optimization for MRAM

This brief introduces a read bias circuit to improve readout yield of magnetic random access memories (MRAMs). A dynamic bias optimization (DBO) circuit is proposed to enable the real-time tracking of the optimal read voltage across MRAM process variations and operating temperature fluctuation within an MRAM array. It optimizes read performance by adjusting the read bias voltage dynamically for maximum sensing margin. Simulation results on a 28-nm 1Mb MRAM macro show that the tracking accuracy of the proposed DBO circuit remains above 90% even when the optimal sensing voltage varies up to 50%. Such dynamic tracking strategy further results in up to two orders of magnitude reduction in the bit error rate with respect to different variations, highlighting its effectiveness in enhancing MRAM performance and reliability.