显微镜
帧(网络)
计算机科学
分辨率(逻辑)
人工智能
降噪
噪音(视频)
计算机视觉
衍射
光学
图像分辨率
图像质量
图像(数学)
物理
电信
作者
Xi Cheng,Jun Li,Qiang Dai,Zhenyong Fu,Jian Yang
标识
DOI:10.1109/tim.2022.3161721
摘要
Structured illumination microscopy (SIM) is an important super-resolution-based microscopy technique that breaks the diffraction limit and enhances optical microscopy systems. With the development of biology and medical engineering, there is a high demand for real-time and robust SIM imaging under extreme low-light and short-exposure environments. Existing SIM techniques typically require multiple structured illumination frames to produce a high-resolution image. In this article, we propose a single-frame SIM (SF-SIM) based on deep learning. Our SF-SIM only needs one shot of a structured illumination frame and generates similar results compared with the traditional SIM systems that typically require 15 shots. In our SF-SIM, we propose a noise estimator that can effectively suppress the noise in the image and enable our method to work in the low-light and short-exposure environment without the need for stacking multiple frames for nonlocal denoising. We also design a bandpass attention module that makes our deep network more sensitive to the change of frequency and enhances the imaging quality. Our proposed SF-SIM is almost 14 times faster than traditional SIM methods when achieving similar results. Therefore, our method is significantly valuable for the development of microbiology and medicine.
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