光学
折射率
散射
全内反射
穿透深度
材料科学
电介质
X射线光学
光散射
球体
几何光学
渗透(战争)
物理
X射线
光电子学
运筹学
天文
工程类
作者
Dennis C. Prieve,John Y. Walz
出处
期刊:Applied optics
[The Optical Society]
日期:1993-03-20
卷期号:32 (9): 1629-1629
被引量:167
摘要
A ray-optics scattering model has been developed to determine if multiple reflections between the sphere and the plate could alter the exponential relationship between the scattering intensity and the separation distance as contact is approached. Results indicate that the effect of multiple reflections is dependent on sphere size, refractive indices, and the penetration depth of the evanescent wave. An experimental validation of the model was performed with polystyrene spheres (diameters 7–30 μm) immersed in an alcohol mixture and resting on an MgF2 film that had the same refractive index. Film thicknesses varied between 0 and 300 nm. No significant effect of multiple reflections was measured at an incident angle approximately 2° above the critical angle, which was in agreement with the predictions of the ray-optics model. By contrast, the scattering intensity from a 300-μm sphere was predicted to be much more sensitive to the separation distance at separations below one penetration depth when the incident angle was increased to over 6° above the critical angle.
科研通智能强力驱动
Strongly Powered by AbleSci AI