光学
折射率
散射
全内反射
穿透深度
材料科学
电介质
X射线光学
光散射
球体
几何光学
渗透(战争)
物理
X射线
光电子学
运筹学
天文
工程类
作者
Dennis C. Prieve,John Y. Walz
出处
期刊:Applied optics-OT
[Optica Publishing Group]
日期:1993-03-20
卷期号:32 (9): 1629-1629
被引量:170
摘要
A ray-optics scattering model has been developed to determine if multiple reflections between the sphere and the plate could alter the exponential relationship between the scattering intensity and the separation distance as contact is approached. Results indicate that the effect of multiple reflections is dependent on sphere size, refractive indices, and the penetration depth of the evanescent wave. An experimental validation of the model was performed with polystyrene spheres (diameters 7-30 microm) immersed in an alcohol mixture and resting on an MgF(2) film that had the same refractive index. Film thicknesses varied between 0 and 300 nm. No significant effect of multiple reflections was measured at an incident angle approximately 2 degrees above the critical angle, which was in agreement with the predictions of the ray-optics model. By contrast, the scattering intensity from a 300-microm sphere was predicted to be much more sensitive to the separation distance at separations below one penetration depth when the incident a ngle was increased to over 6 degrees above the critical angle.
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