Optimization of a quantum weak measurement system with its working areas

Phase-sensitive weak measurement systems have been receiving an increasing amount of attention. In this paper, we introduce a series of weak measurement working areas. By adjusting the pre-selection and post-selection states and the total phase difference between vertically polarized light and horizontally polarized light, the measurement of the weak value is amplified by several times in one system. Its applicability is verified in a label-free total internal reflection system. The original sensitivity and resolution are improved at different working areas, reaching 1.85 um/refractive index unit (RIU) and 6.808 × 10-7 RIU, respectively.