漂移速度
饱和速度
电场
电子
电子迁移率
速度饱和
散射
量子阱
凝聚态物理
物理
饱和(图论)
原子物理学
电压
光学
MOSFET
组合数学
量子力学
晶体管
数学
激光器
作者
Mustafa Aydın,Selman Mutlu,Ayşe Erol,Janne Puustinen,Joonas Hilska,Mircea Guină,Ömer Dönmez
标识
DOI:10.1002/pssr.202200204
摘要
The drift velocity ( v drift ) of electrons in an n‐type modulation‐doped GaAs 0.96 Bi 0.04 /Al 0.15 Ga 0.85 As quantum well (QW) structure is determined for electric fields ( F ) ranging from ≈0.4 to 3.58 kV cm −1 . The resulting v drift characteristic exhibited a linear increase and reached ≈6 × 10 6 cm s −1 at low electric fields then almost saturated with increasing electric field. The electron drift mobility is determined as 2265 cm 2 Vs −1 in the regime where the drift velocity is linear with respect to the electric field. The drift velocity saturates at ≈6.1 × 10 6 cm s −1 at the electric fields between ≈2.7 and 3.4 kV cm −1 . Saturation of the drift velocity is attributed to the transfer of the electrons from the QW layer (GaAs 0.96 Bi 0.04 ) with higher electron mobility to the barrier layer (Al 0.15 Ga 0.85 As) and satellite valley L‐valley with lower electron mobility, which initiates cooling of electrons via phonon scattering in the sample.
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