材料科学
二极管
光电子学
分辨率(逻辑)
光学
图像分辨率
光子
高分辨率
物理
遥感
计算机科学
地质学
人工智能
作者
Zhixin Peng,Xiaohu Hou,Zhao Han,Zhiyu Gan,Chen Li,Feihong Wu,Shiyu Bai,Shujie Yu,Yan Liu,Kai Yang,Xiao Feng,Haoyan Zhan,Xiaolong Zhao,Guangwei Xu,Shibing Long
标识
DOI:10.1002/adfm.202405277
摘要
Abstract Sensitive high‐energy photon detection from UV to X‐ray and high‐resolution array imaging are critical for medical diagnosis, space exploration, and scientific research. The key challenges for high‐performance photodetector and imaging arrays are the effective material and device design strategies for the miniaturization and integration of the device. Here, photon‐controlled diodes (i.e., the detector has rectifying characteristics only under light irradiation) are proposed for high‐resolution and anti‐crosstalk array imaging applications without integrating the switching element. Based on ultra‐wide bandgap semiconductor Ga 2 O 3 , the sensitive DUV/X‐ray photon‐controlled diodes are realized by the design of high‐resistance Ga 2 O 3 film and high‐barrier contact. The device exhibits remarkable detection performance, including high photo‐responsivity (168 A W −1 ) and specific detectivity (1.45 × 10 15 Jones) under DUV illumination, as well as a high sensitivity (1.23 × 10 5 µ C Gy air −1 cm −2 ) under X‐ray light. Moreover, the low dark current and excellent rectification characteristics are obtained. Furthermore, its potential for high‐density and anti‐crosstalk array imaging applications is verified. These results not only bring forth new insights in the implementation of high‐performance DUV/X‐ray photodetector, but also pave a feasible way to realize high pixel density detector array through the simplified fabrication process for high‐resolution imaging applications.
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