Abstract Band alignment engineering represents an enabling approach in 2D van der Waals heterojunctions for fabricating high‐performance photodetectors. However, there is often a trade‐off between high responsivity and high response speed when using a single type of band alignment. Here, a broadband polarization‐sensitive Bi 2 Te 3 /GeSe heterojunction photodetector is designed and fabricated, whose band alignment transfers from type II to type III by applying a forward bias voltage, allowing for the photogenerated electrons in GeSe enter into Bi 2 Te 3 via band‐to‐band tunneling (BTBT) mechanism. Meanwhile, the photogenerated carriers can be easily separated without the influence of heterojunction interface barrier. The device exhibits a maximum responsivity of 1.62 × 10 4 A W −1 in the visible range and 1.31 × 10 3 A W −1 in the near‐infrared range. The device detects high‐frequency modulated light up to 15 kHz. In addition, the unexpected pyroelectric effect at 1550 nm in a Bi 2 Te 3 /GeSe heterojunction breaks symmetry limitations, generating high instantaneous currents that enhance responsivity. Significantly, a photocurrent polarization ratio of 2.08 is attained at near‐infrared band, demonstrating superior polarization‐sensitive detection and imaging capabilities. The work provides novel insights for the field of optoelectronics.