电磁干扰
高电子迁移率晶体管
转换器
电磁干扰
噪音(视频)
电阻抗
传导电磁干扰
行为建模
降压式变换器
晶体管
电压
功率(物理)
电子工程
电气工程
等效电路
工程类
物理
计算机科学
量子力学
图像(数学)
人工智能
作者
Chuang Bi,Heyang Shan,Kai Gao,Shaojing Wang,Peng Xu
标识
DOI:10.26866/jees.2023.3.r.163
摘要
Behavioral models of common mode (CM) electromagnetic interference (EMI) are proposed herein for a GaN high-electron-mobility transistor (HEMT) synchronous buck converter. First, a CM noise model is developed using a linear equivalent circuit that consists of a voltage source, current source, and two noise impedances. The behavioral parameters of the CM model are then extracted by changing the input-side shunt impedances. A GaN HEMT buck converter setup is then built using switching frequencies of 100 kHz, 200 kHz, and 500 kHz to verify the validity of the CM EMI behavioral model. A comparison between the experimental and predicted results indicated that the proposed CM EMI model of GaN-based power converters was able to predict well the CM EMI current in the 150 kHz–30 MHz frequency range.
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