镀铜
PEG比率
铜
聚乙二醇
电镀
扫描电子显微镜
材料科学
电镀(地质)
电化学
化学工程
光学显微镜
冶金
电极
化学
复合材料
图层(电子)
物理化学
工程类
经济
地球物理学
地质学
财务
作者
Wei‐Ping Dow,Ming-Yao Yen,Wen-Bing Lin,Shih-Wei Ho
摘要
The influence of the molecular weight (Mw) of polyethylene glycol (PEG) on the microvia filling by copper electroplating was demonstrated and examined by cross-sectional images using an optical microscope. The electrochemical behavior of PEG of different molecule weights in the copper electroplating was characterized by galvanostatic measurement. In the presence of excess , the surface coverage of PEG of various Mw adsorbed on the copper surface was characterized by observing the size and distribution of CuCl precipitates using a scanning electron microscope. As PEG Mw was increased, the best filling performance of plating formula was obtained when the PEG Mw ranged from . Only large PEG amounts whose Mw exceeds can effectively polarize the cathode, in turn inducing the catalytic effect of bis(3-sulfopropyl) disulfide on copper deposition, resulting in a synergistic interaction between the suppressor and accelerator on the microvia filling.
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