拉曼光谱
材料科学
薄膜
极化(电化学)
光电子学
纳米技术
光学
化学
物理
物理化学
作者
Yu Luo,Jundong Zhang,Weitao Su,Fei Chen,Yijie Zeng,Hongwei Lu,P. Chen
摘要
ABSTRACT ReS 2 thin layers exhibit polarization‐dependent Raman behaviors owing to anisotropic electron–phonon interaction. Herein, we observed anomalous Raman polarization behaviors of ReS 2 flakes prepared on Au thin films. In the angle‐resolved polarization Raman spectroscopy (ARPRS) measurement, the intensity polarization plots of different Raman modes of the ReS 2 flakes prepared on gold thin film rotate by certain angles compared with those of the same flake prepared on SiO 2 . In particular, such rotation depends strongly on the flake thickness and the excitation laser wavelengths. The maximum rotation angles can be 14.8° for the mode of the 3L and 40° for the mode of the 7L, respectively. Such observations greatly enrich the anisotropic optical behaviors of ReS 2 , which may facilitate the design of future anisotropic optoelectronic devices.
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