材料科学
薄膜晶体管
锌
氮化物
光电子学
纳米技术
冶金
图层(电子)
作者
Miguel A. Domínguez,J. L. Pau,A. Redondo‐Cubero
出处
期刊:European Physical Journal-applied Physics
[EDP Sciences]
日期:2024-01-01
卷期号:99: 9-9
标识
DOI:10.1051/epjap/2024230169
摘要
In this work, the characterization of zinc nitride (Zn 3 N 2 ) Thin-film Transistors (TFTs) as phototransistors is presented. Polyethylene terephthalate is used as recyclable plastic substrate. A zinc oxide (ZnO) film is used as passivation layer. The Zn 3 N 2 and ZnO films are deposited at room temperature using a magnetron sputtering. The sensitivity, responsivity and detectivity were extracted and analyzed. Interestingly, a relation between the maximum value of detectivity and the threshold voltage V T was found. Moreover, the electrical characteristics are analyzed after 100 days on air to evaluate the stability under ambient conditions.
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