材料科学
闪烁体
单晶
掺杂剂
光电效应
卤化物
兴奋剂
电子迁移率
铜
光电子学
X射线探测器
Crystal(编程语言)
X射线
分析化学(期刊)
检出限
探测器
光学
结晶学
物理
无机化学
化学
程序设计语言
色谱法
计算机科学
冶金
作者
Qinhua Wei,Xiongsheng Fan,Xiang Peng,Laishun Qin,Wenjun Liu,Tingting Shi,Yin Hang,Peiqing Cai,Yufeng Tong,Gao Tang,Zugang Liu,Paul K. Chu,Hongsheng Shi,Yanliang Liu,Xue‐Feng Yu
标识
DOI:10.1002/adom.202300247
摘要
Abstract Low‐dimensional copper‐based halide single crystals are considered excellent scintillators for indirect X‐ray detection, but their potential in direct X‐ray detection has not been investigated. Herein, high‐quality pure Cs 3 Cu 2 I 5 and Li‐doped Cs 3 Cu 2 I 5 :Li single crystals are grown by the Bridgman method. The Li + dopant enhances the photoelectric properties of the Cs 3 Cu 2 I 5 single crystal by extending the carrier lifetime, improving the carrier mobility from 6.49 to 9.52 cm 2 V −1 s −1 , and increasing the mobility‐lifetime (µ τ ) product from 1.4 × 10 −4 to 2.9 × 10 −4 cm 2 V −1 . The sensitive direct X‐ray detector with a vertical device configuration of Au/Cs 3 Cu 2 I 5 :Li single crystal/PCBM/Au is fabricated and demonstrated to have a high sensitivity of 831.1 µC Gy air −1 cm −2 and low detection limit of 34.8 nGy air s −1 . Furthermore, the detector shows negligible baseline current drift and excellent stability upon X‐ray radiation.
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