断层重建
扫描透射电子显微镜
材料科学
投影(关系代数)
暗场显微术
人工智能
断层摄影术
电子断层摄影术
深度学习
无监督学习
计算机科学
迭代重建
模式识别(心理学)
透射电子显微镜
计算机视觉
光学
纳米技术
物理
算法
显微镜
作者
Eunju Cha,Hyungjin Chung,Jaeduck Jang,Junho Lee,Eunha Lee,Jong Chul Ye
出处
期刊:ACS Nano
[American Chemical Society]
日期:2022-06-22
卷期号:16 (7): 10314-10326
被引量:7
标识
DOI:10.1021/acsnano.2c00168
摘要
High-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) can be acquired together with energy dispersive X-ray (EDX) spectroscopy to give complementary information on the nanoparticles being imaged. Recent deep learning approaches show potential for accurate 3D tomographic reconstruction for these applications, but a large number of high-quality electron micrographs are usually required for supervised training, which may be difficult to collect due to the damage on the particles from the electron beam. To overcome these limitations and enable tomographic reconstruction even in low-dose sparse-view conditions, here we present an unsupervised deep learning method for HAADF-STEM-EDX tomography. Specifically, to improve the EDX image quality from low-dose condition, a HAADF-constrained unsupervised denoising approach is proposed. Additionally, to enable extreme sparse-view tomographic reconstruction, an unsupervised view enrichment scheme is proposed in the projection domain. Extensive experiments with different types of quantum dots show that the proposed method offers a high-quality reconstruction even with only three projection views recorded under low-dose conditions.
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