灵敏度(控制系统)
材料科学
表征(材料科学)
工艺工程
纳米技术
工程类
电子工程
作者
Yuqiao Wang,Xin Li,Shusen Chen,Xiao Ma,Ziyang Yu,Shaohua Jin,Lijie Li,Yu Chen
出处
期刊:Materials
[MDPI AG]
日期:2017-08-21
卷期号:10 (8): 974-974
被引量:21
摘要
The internal defects and shape of cyclotrimethylenetrinitramine (RDX) crystal are critical parameters for the preparation of reduced sensitivity RDX (RS-RDX). In the current study, RDX was re-crystallized and spheroidized to form the high-quality RDX that was further characterized by purity, apparent density, size distribution, specific surface area, impact sensitivity, and shock sensitivity. The effects of re-crystallization solvent on the growth morphology of RDX crystal were investigated by both theoretical simulation and experiment test, and consistent results were obtained. The high-quality RDX exhibited a high purity (≥99.90%), high apparent density (≥1.811 g/cm³), spherical shape, and relatively low impact sensitivity (6%). Its specific surface area was reduced more than 30%. Compared with conventional RDXs, the high-quality RDX reduced the shock sensitivities of PBXN-109 and PBXW-115 by more than 30%, indicating that it was a RS-RDX. The reduced sensitivity and good processability of the high-quality RDX would be significant in improving the performances of RDX-based PBXs.
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