Kinetic Model of Energy Relaxation in CsI:A (A = Tl and In) Scintillators

A model of energy relaxation in alkali halide scintillators doped with Tl-like activators is presented. Interaction between thermalized charge carriers, their diffusion, and capture by traps are considered. The model of energy relaxation suggested in the work includes essential electron excited states in alkali halides doped with Tl-like activators. Self-trapping of holes occurs in alkali halides at LNT, giving rise to creation of self-trapped excitons (STEs). Thallium-like activator impurity can act both as an electron or a hole trap. Once both of the charge carriers are trapped by the dopant, activator recombination channel comes to action. The model is verified using CsI classical scintillation crystals doped with thallium and indium ions in a range of concentrations from 10–4 to 10–1 mol %. Temperature dependences of the STE and the activator-induced emission yield are measured as a function of the activator concentration under continuous X-ray excitation. A system of rate equations is used to simulate the applicability of the model under different excitation conditions. Evaluation of the parameters of the system is done for a numerical solution. The model of energy relaxation suggested allows to explain energy losses in CsI:A scintillators in a 10–300 K temperature range.