硫系化合物
纳秒
材料科学
非易失性存储器
无定形固体
相变存储器
电压
肖特基二极管
光电子学
纳米技术
电气工程
光学
化学
激光器
结晶学
图层(电子)
工程类
物理
二极管
作者
Jiabin Shen,Shujing Jia,Nannan Shi,Qingqin Ge,Tamihiro Gotoh,Shilong Lv,Qi Liu,Richard Dronskowski,Stephen R. Elliott,Zhitang Song,Min Zhu
出处
期刊:Science
[American Association for the Advancement of Science]
日期:2021-12-09
卷期号:374 (6573): 1390-1394
被引量:100
标识
DOI:10.1126/science.abi6332
摘要
Nonvolatile phase-change memory has been successfully commercialized, but further density scaling below 10 nanometers requires compositionally and structurally homogeneous materials for both the memory cell and the associated vertically stacked two-terminal access switch. The selector switches are mostly amorphous-chalcogenide Ovonic threshold switches (OTSs), operating with a nonlinear current response above a threshold voltage in the amorphous state. However, they currently suffer from the chemical complexity introduced by the quaternary or even more diverse chalcogenide compositions used. We present a single-element tellurium (Te) volatile switch with a large (≥11 megaamperes per square centimeter) drive current density, ~103 ON/OFF current ratio, and faster than 20 nanosecond switching speed. The low OFF current arises from the existence of a ~0.95–electron volt Schottky barrier at the Te–electrode interface, whereas a transient, voltage pulse–induced crystal-liquid melting transition of the pure Te leads to a high ON current. Our discovery of a single-element electrical switch may help realize denser memory chips.
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