材料科学
电导率
兴奋剂
离子电导率
肖特基二极管
肖特基势垒
介电谱
离子键合
单晶
凝聚态物理
偏压
电阻率和电导率
分析化学(期刊)
光电子学
离子
结晶学
电压
化学
电化学
电极
电气工程
电解质
物理化学
二极管
物理
工程类
有机化学
色谱法
作者
Leila Ghadbeigi,Rujun Sun,Jani Jesenovec,Arkka Bhattacharyya,John S. McCloy,Sriram Krishnamoorthy,Michael A. Scarpulla,Berardi Sensale‐Rodriguez
摘要
In this work, we quantify electronic and ionic contributions to conductivity in the bulk and depletion widths of back-to-back sputtered Pt Schottky contacts on single crystals of β-Ga2O3. We also demonstrate asymmetric changes to these contacts induced by DC bias at temperatures as low as 200 °C, which has obvious bearing on the performance and reliability of devices. Crystals, which were unintentionally doped, doped with Zr donors, and doped with Mg acceptors, were characterized from room temperature to 900 °C. Electrochemical impedance spectroscopy, current–voltage (IV), capacitance–voltage, and the Wagner DC polarization method were employed to characterize changes in conductivity, doping, and built-in potentials with temperature and bias. This work demonstrates that ionic conductivity can be on-par with electronic conductivity in multiple circumstances in bulk crystal samples and leads to changes in Schottky contacts with an applied bias. While it has not been demonstrated that these phenomena are endemic to all melt-grown β-Ga2O3 crystals and epitaxially grown layers were not investigated, these results highlight the importance of understanding and controlling ionic conductivity and defect reactions involving impurities and native defects to enable reliable and long-lived β-Ga2O3 power devices.
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