X射线光电子能谱
单层
材料科学
扫描隧道显微镜
基质(水族馆)
外延
分子束外延
光电发射光谱学
密度泛函理论
结晶学
分析化学(期刊)
纳米技术
化学
计算化学
图层(电子)
物理
核磁共振
地质学
海洋学
色谱法
作者
Kun Qian,Ling Gao,Hui Li,Shuang-Nan Zhang,Jiaqiang Yan,C.T. Liu,Jing Wang,Tianmei Qian,Hong Ding,Y. Zhang,Xin Lin,S. X. Du,Haiyan Gao
出处
期刊:Chinese Physics B
[IOP Publishing]
日期:2020-01-01
卷期号:29 (1): 018104-018104
被引量:15
标识
DOI:10.1088/1674-1056/ab5781
摘要
A new two-dimensional atomic crystal, monolayer cuprous telluride (Cu 2 Te) has been fabricated on a graphene-SiC(0001) substrate by molecular beam epitaxy (MBE). The low-energy electron diffraction (LEED) characterization shows that the monolayer Cu 2 Te forms a 3 × 3 superstructure with respect to the graphene substrate. The atomic structure of the monolayer Cu 2 Te is investigated through a combination of scanning tunneling microscopy (STM) experiments and density functional theory (DFT) calculations. The stoichiometry of the Cu 2 Te sample is verified by x-ray photoelectron spectroscopy (XPS) measurement. The angle-resolved photoemission spectroscopy (ARPES) data present the electronic band structure of the sample, which is in good agreement with the calculated results. Furthermore, air-exposure experiments reveal the chemical stability of the monolayer Cu 2 Te. The fabrication of this new 2D material with a particular structure may bring new physical properties for future applications.
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