Electrical Fast Transients Monitoring Based on a Noncontact Voltage Measurement Technology

In this paper, a noncontact monitoring method based on a noncontact voltage probe in electrical fast transients (EFT) test is developed. This method uses Fourier transform and inverse Fourier transform to reconstruct the injected interference pulse waveform. By comparing the measurement results and reconstructed waveform, the validity of the measurement method is confirmed. The method is applied for the actual EFT test, and the test results show that the reconstructed waveform has only a 2% difference from the actual measurement result.