焦绿石
透射电子显微镜
钙钛矿(结构)
材料科学
相(物质)
电子显微镜
化学物理
微观结构
矿物学
结晶学
纳米技术
化学
光学
冶金
物理
有机化学
作者
Jong‐Hoon Kim,Yun Jae Jeong,Woo Tae Jang,You Jung Kim,INa Shin,Chung Soo Kim,Ji Hye Lee,Bae Ho Park,Jae-Hyeon Cho,Wook Jo,Young Heon Kim
标识
DOI:10.1016/j.apsusc.2024.159566
摘要
Multi-cation perovskite thin films are attracting significant research attention, owing to their unique physical properties. In particular, studies that provide insight into the microstructural properties and growth mechanisms of multi-cation Pb-based complex oxide thin films are highly desirable. The microstructural properties of Pb-based complex oxide thin films were studied using various transmission electron microscopy (TEM) techniques. The pyrochlore structure was elucidated by studying the atomic structure using HR (high-resolution) TEM, fast Fourier transform, and HR high-angle annular dark-field scanning transmission electron analyses. Additionally, the chemical properties of the multi-cation sites were characterized by energy-dispersive X-ray spectrometry, whereby the chemical composition of the pyrochlore structure was identified as Pb2(Nb0.56Zr0.77Ti0.67)O7 and that of the perovskite structure as Pb(Nb0.4Zr0.3Ti0.3)O3. The specific orientation relationship, [110]Pyrochlore//[010]Perovskite and (2¯20)Pyrochlore//(100)Perovskite, was confirmed between the pyrochlore and perovskite structures at the bottom area of the layer. However, tilting of the pyrochlore-structured grains was frequently observed with increasing thickness. Finally, recovery of the interplanar spacings was observed in the perovskite and pyrochlore phases.
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