焦绿石
透射电子显微镜
钙钛矿(结构)
材料科学
相(物质)
电子显微镜
化学物理
微观结构
矿物学
结晶学
纳米技术
化学
光学
冶金
物理
有机化学
作者
Jong Hoon Kim,Yun Jae Jeong,W. Y. Jang,You Jung Kim,Im-Hee Shin,Chung Soo Kim,Ji Hye Lee,Bae Ho Park,Jae-Hyeon Cho,Wook Jo,Young Heon Kim
标识
DOI:10.1016/j.apsusc.2024.159566
摘要
Multi-cation perovskite thin films are attracting significant research attention, owing to their unique physical properties. In particular, studies that provide insight into the microstructural properties and growth mechanisms of multi-cation Pb-based complex oxide thin films are highly desirable. The microstructural properties of Pb-based complex oxide thin films were studied using various transmission electron microscopy (TEM) techniques. The pyrochlore structure was elucidated by studying the atomic structure using HR (high-resolution) TEM, fast Fourier transform, and HR high-angle annular dark-field scanning transmission electron analyses. Additionally, the chemical properties of the multi-cation sites were characterized by energy-dispersive X-ray spectrometry, whereby the chemical composition of the pyrochlore structure was identified as Pb2(Nb0.56Zr0.77Ti0.67)O7 and that of the perovskite structure as Pb(Nb0.4Zr0.3Ti0.3)O3. The specific orientation relationship, [110]Pyrochlore//[010]Perovskite and (2¯20)Pyrochlore//(100)Perovskite, was confirmed between the pyrochlore and perovskite structures at the bottom area of the layer. However, tilting of the pyrochlore-structured grains was frequently observed with increasing thickness. Finally, recovery of the interplanar spacings was observed in the perovskite and pyrochlore phases.
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