储能
材料科学
兴奋剂
电场
电介质
电容器
光电子学
航程(航空)
分析化学(期刊)
纳米技术
电气工程
电压
化学
复合材料
热力学
物理
工程类
功率(物理)
量子力学
色谱法
作者
Hien Vu,Hung V. Vu,Guus Rijnders,Minh Dung Nguyen
标识
DOI:10.1016/j.jallcom.2023.171837
摘要
The stability of high energy-storage performance dielectric-film capacitors with respect to frequency, temperature, and cycle number is very essential for developing energy-storage devices. Here, the impact of Sm-doping concentration on the structure and energy-storage stability of lead-free Ba(Zr0.35Ti0.65)O3 (BZT) films have been systematically investigated. The formation of random electric fields, due to the co-occupying heterovalent ions of Sm3+/Ti4+ at the B-sites, serves to enhance the breakdown strength and reduce the polarization reversibility. As a result, an enhanced recoverable energy-storage density of 133.3 J/cm3 and an excellent energy efficiency of 89.4% are simultaneously achieved in 25 mol% Sm-doped BZT films (BZT-Sm25) under an applied electric field of 7.0 MV/cm. In addition, the BZT-Sm25 films also exhibit outstanding energy-storage performance stability over a large frequency-range of 1–1000 Hz, a wide temperature-range of 25 °C–200 °C, and beyond 1010 switching-cycles, even under a high electric field of 6 MV/cm. These achieved results demonstrate that the Sm-doped BZT films are promising candidates for the development of high-performance and environmentally friendly energy-storage devices.
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