单层
材料科学
钝化
X射线光电子能谱
退火(玻璃)
钙钛矿(结构)
能量转换效率
串联
硅
氧化物
化学工程
自组装单层膜
纳米技术
氧化铈
光电子学
图层(电子)
复合材料
冶金
工程类
作者
Oussama Er‐raji,Stefan Lange,Carl Eric Hartwig,Adi Prasetio,Martin Bivour,Martin Hermle,Marko Turek,Stefaan De Wolf,Stefan W. Glunz,Juliane Borchert,Patricia S. C. Schulze
标识
DOI:10.1002/smtd.202401758
摘要
Self-assemble monolayers (SAMs) have become state-of-the-art hole-selective contacts for high-efficiency perovskite-based solar cells due to their easy processing, passivation capability, and low parasitic absorption. Nevertheless, for the deposition of SAMs with a monolayer thickness and a high packing density on metal oxide substrates, critical challenges persist. To overcome these, the study focuses on the impact of annealing temperature - an intrinsic yet so far unexplored process parameter - during the formation of SAMs. By performing in situ angle-resolved X-ray photoelectron spectroscopy combined with advanced data analysis routines, it is revealed that increasing the annealing temperature reduces the formed SAM layer thickness from a multilayer stack of ≈5 nm at 100 °C (conventional temperature employed in literature) to a monolayer at 150 °C. Furthermore, denser adsorption of the SAM to the metal oxide surface is promoted at high temperatures, which enhances the interfacial SAM/perovskite passivation quality. With this strategy, a 1.3%abs power conversion efficiency (PCE) increment is obtained in fully-textured perovskite/silicon tandem solar cells, with improved reproducibility, and a champion device approaching 30% PCE. This study advances the understanding of SAMs formation and presents a promising strategy for further progress in high-efficiency perovskite-based solar cells.
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