石墨烯
材料科学
接触角
氧化物
拉曼光谱
傅里叶变换红外光谱
X射线光电子能谱
化学工程
基质(水族馆)
氧化硅
氧化石墨烯纸
硅
共价键
纳米技术
复合材料
化学
有机化学
光学
海洋学
冶金
工程类
地质学
氮化硅
物理
作者
Junfei Ou,Jinqing Wang,Sheng Liu,Bo Mu,Junfang Ren,Honggang Wang,Shengrong Yang
出处
期刊:Langmuir
[American Chemical Society]
日期:2010-09-28
卷期号:26 (20): 15830-15836
被引量:307
摘要
Reduced graphene oxide (RGO) sheets were covalently assembled onto silicon wafers via a multistep route based on the chemical adsorption and thermal reduction of graphene oxide (GO). The formation and microstructure of RGO were analyzed by X-ray photoelectron spectroscopy (XPS), attenuated total reflectance Fourier transform infrared (ATR-FTIR) spectroscopy, Raman spectroscopy, and water contact angle (WCA) measurements. Characterization by atomic force microscopy (AFM) was performed to evaluate the morphology and microtribological behaviors of the samples. Macrotribological performance was tested on a ball-on-plate tribometer. Results show that the assembled RGO possesses good friction reduction and antiwear ability, properties ascribed to its intrinsic structure, that is, the covalent bonding to the substrate and self-lubricating property of RGO.
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