氧化铟锡
基质(水族馆)
材料科学
钨
电化学
氧化物
铟
氧化锡
无机化学
薄膜
循环伏安法
扫描电子显微镜
三氧化钨
化学浴沉积
化学工程
化学
纳米技术
电极
冶金
复合材料
物理化学
工程类
地质学
海洋学
作者
Wan Danial Shahizuan,Yusairie Mohd
出处
期刊:Universiti Tun Hussein Onn Malaysia - International Journal of Sustainable Construction Engineering and Technology
日期:2012-01-01
卷期号:4 (1)
摘要
An investigation on the influence of pH solution on the formation of tungsten oxide (WO3) films on indium tin oxide (ITO) - coated glass substrate was carried out. The films have been electrochemically deposited from bath solution containing Na2WO4.2H2O and H2O2 at different pH values using constant potential of -0.45V vs Ag/AgCl for 300s. The surface morphology and crystalline structure of the prepared films were characterized by field emission scanning electron microscope (FESEM) and X-ray diffraction (XRD), respectively. The electrochemical behaviour of the films in 1 M HNO3 was measured by cyclic voltammetry (CV). It was observed that the morphology and electrochemical behavior of WO3 films strongly depend on pH value. A smooth and thin WO3 film was deposited on ITO from pH solution of 1.30; however, the deposition at lower pH value (i.e.: pH=0.80) under the same electrodeposition conditions has produced a porous and thick film. The porous film has greatly enhanced the electrochemical behaviour of WO3 for intercalation and deintercalation of H+ ions due to its high surface area.
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