极紫外光刻
抛光
光学
X射线光学
计量学
平版印刷术
物理
自适应光学
光学涂层
计算机科学
材料科学
涂层
纳米技术
复合材料
X射线
作者
Paul Graeupner,Peter Kuerz,Jan van Schoot,Judon Stoeldraijer
摘要
To further increase the resolution of EUV scanners ZEISS is working on next generation EUV optics with an increased NA of 0.55. This next generation optics consists of a highly flexible illumination system and projection optics with NA 0.55 to allow scaling beyond the next decade. In this presentation we will present the status of the high-NA optics program at ZEISS. We report on the high NA infrastructure including mirror polishing, coating, surface figure metrology, mirror handling, and integration tooling. Progress in manufacturing of mechanics, frames and mirrors at ZEISS for both illuminator and POB will be shown.
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