光刻胶
材料科学
微观结构
水溶液
平版印刷术
降级(电信)
抵抗
纳米技术
激光器
可见光谱
辐照
化学工程
光电子学
光学
复合材料
计算机科学
化学
有机化学
核物理学
电信
工程类
图层(电子)
物理
作者
Marvin Gernhardt,Vinh X. Truong,Christopher Barner‐Kowollik
标识
DOI:10.1002/adma.202203474
摘要
Abstract The additive manufacturing technique direct laser writing (DLW), also known as two‐photon laser lithography, is becoming increasingly established as a technique capable of fabricating functional 3D microstructures. Recently, there has been an increasing effort to impart microstructures fabricated using DLW with advanced functionalities by introducing responsive chemical entities into the underpinning photoresists. Herein, a novel photoresist based on the photochemistry of the bimane group is introduced that can be degraded upon exposure to very mild conditions, requiring only water and visible light (λ max = 415–435 nm) irradiation. The degradation of the microstructures is tracked and quantified using AFM measurements of their height. The influence of the writing parameters as well as the degradation conditions is investigated, unambiguously evidencing effective visible light degradation in aqueous environments. Finally, the utility of the photodegradable resist system is demonstrated by incorporating it into multimaterial 3D microstructures, serving as a model for future applications.
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