石墨烯
材料科学
拉曼光谱
单层
密度泛函理论
外延
电子迁移率
纳米技术
石墨烯纳米带
扫描透射电子显微镜
基质(水族馆)
化学物理
凝聚态物理
透射电子显微镜
光电子学
图层(电子)
光学
计算化学
化学
地质学
物理
海洋学
作者
Georg Zagler,Alberto Trentino,Kimmo Mustonen,Clemens Mangler,Jani Kotakoski
出处
期刊:2D materials
[IOP Publishing]
日期:2023-08-21
卷期号:10 (4): 045025-045025
被引量:3
标识
DOI:10.1088/2053-1583/acf22e
摘要
Abstract Poor quality interfaces between metal and graphene cause non-linearity and impair the carrier mobility in graphene devices. Here, we use aberration corrected scanning transmission electron microscopy to observe hexagonally close-packed Ti nano-islands grown on atomically clean graphene, and establish a 30 ∘ epitaxial relationship between the lattices. Due to the strong binding of Ti on graphene, at the limit of a monolayer, the Ti lattice constant is mediated by the graphene epitaxy, and compared to bulk Ti, is strained by ca. 3.7% to a value of 0.306(3) nm. The resulting interfacial strain is slightly greater than what has been predicted by density functional theory calculations. Our early growth stage investigations also reveal that, in contrast to widespread assumptions, Ti does not fully wet graphene but grows initially in islands with a thickness of 1–2 layers. Raman spectroscopy implies charge transfer between the Ti islands and graphene substrate.
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