光伏系统
降级(电信)
多样性(控制论)
工程物理
环境科学
计算机科学
材料科学
工程类
电气工程
人工智能
作者
Roland Rösch,David M. Tanenbaum,Mikkel Jørgensen,Marco Seeland,Maik Bärenklau,Martin Hermenau,Eszter Vörösházi,Matthew T. Lloyd,Yulia Galagan,Birger Zimmermann,Uli Würfel,Markus Hösel,Henrik F. Dam,Suren A. Gevorgyan,Suleyman Kudret,Wouter Maes,Laurence Lutsen,Dirk Vanderzande,Ronn Andriessen,Gerardo Terán-Escobar
摘要
The investigation of degradation of seven distinct sets (with a number of individual cells of n $ 12) of state of the art organic photovoltaic devices prepared by leading research laboratories with a combination of imaging methods is reported. All devices have been shipped to and degraded at Risø DTU up to 1830 hours in accordance with established ISOS-3 protocols under defined illumination conditions. Imaging of device function at different stages of degradation was performed by laser-beam induced current (LBIC) scanning; luminescence imaging, specifically photoluminescence (PLI) and electroluminescence (ELI); as well as by lock-in thermography (LIT). Each of the imaging techniques exhibits its specific advantages with respect to sensing certain degradation features, which will be compared and discussed here in detail. As a consequence, a combination of several imaging techniques yields very conclusive information about the degradation processes controlling device function. The large variety of device architectures in turn enables valuable progress in the proper interpretation of imaging results—hence revealing the benefits of this large scale cooperation in making a step forward in the understanding of organic solar cell aging and its interpretation by state-of-the-art imaging methods.
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