Development of Chipping Inspection System of Cutting Knife Edge Using Spatial Filtering

Authors proposed a new method for measuring contour shape at submicron level using spatial filtering and confirmed its effectiveness (Yazawa et al. in J SME-Jpn 4:17–22, 2014 []; Miyamoto et al. in Study of chipping inspection of cutting knife using spatial filtering, 2016 []). In this paper, the inspection system is propose, and the prototype is developed.