电致发光
太阳能电池
光辉
开路电压
共发射极
光电子学
校准
材料科学
硅
电压
光学
物理
纳米技术
量子力学
图层(电子)
作者
Toshimitsu Mochizuki,Changsu Kim,Masahiro Yoshita,J. Mitchell,Lin Zhu,Shaoqiang Chen,Hidetaka Takato,Yoshihiko Kanemitsu,Hidefumi Akiyama
摘要
In this work, we propose and demonstrate a durable and distributable Lambertian light-emitter secondary standard using the electroluminescence (EL) of a Si solar cell. This standard is useful for calibration of the absolute sensitivity of an EL-imaging infrared camera used to acquire quick on-site measurements of the absolute EL efficiencies of individual Si solar cells in modules and arrays. The developed method enables the realization of quantitative open-circuit voltage mapping.
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