过电位
烷基
铜
PEG比率
电化学
极化(电化学)
高分子化学
材料科学
电镀
化学工程
化学
无机化学
有机化学
纳米技术
冶金
物理化学
图层(电子)
电极
财务
经济
工程类
作者
Chuanyue Han,Yuehui Zhai,Yuanming Chen,Jiujuan Li,Wen‐Bin Cai,Zhi‐You Zhou,Yan Hong,Chong Wang,Guoyun Zhou
标识
DOI:10.1016/j.surfcoat.2024.130848
摘要
This study explores the structure-activity relationship of copper electroplating suppressors, with a focus on alkyl-terminated polyethylene glycols (PEGs), to better understand their efficacy in electronic interconnect fabrication. Electrochemical analysis demonstrated that an increase in the molecular weight of PEG suppressors significantly raises the electrochemical polarization overpotential during copper electrodeposition. Additionally, alkyl terminal capping was observed to amplify this polarization effect, with the extent of overpotential increase directly correlating with the alkyl chain length. However, the advantageous impact of molecular weight on overpotential diminishes at higher molecular weights. In contrast to the electrochemical results, through-hole electroplating experiments revealed that a suppressor with a molecular weight of 1 k and butyl termination exhibits superior through-hole throwing power. Further analysis indicated that a greater proportion of alkyl functional groups within the suppressor's molecular chain enhances uniform electroplating capabilities. The study also suggests that measuring contact angles, as an expression of hydrophobicity, could provide a more efficient and precise method for evaluating suppressor performance.
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