高电子迁移率晶体管
材料科学
宽禁带半导体
光电子学
无线电频率
氮化镓
晶体管
计算机科学
电气工程
纳米技术
电信
电压
图层(电子)
工程类
作者
José C. Pedro,Pedro M. Tome,Telmo R. Cunha,Filipe M. Barradas,Luís C. Nunes,Pedro M. Cabral,João L. Gomes
出处
期刊:2018 IEEE MTT-S International Wireless Symposium (IWS)
日期:2021-05-23
被引量:10
标识
DOI:10.1109/iws52775.2021.9499373
摘要
This work is an overview of the current understanding of memory effects arising from AlGaN/GaN HEMT based RF power amplifiers. It reviews the most widely accepted physical sources of those memory effects and their impact on the amplifier's linearizability, to then discuss corresponding circuit design approaches to minimize the phenomena. This is illustrated by results of a power amplifier whose short-term and long-term nonlinear memory is compensated by an analog assisted digital pre-distortion scheme.
科研通智能强力驱动
Strongly Powered by AbleSci AI