Inhomogeneity model for anomalous Hall effects in n‐type Hg0.8Cd0.2Te liquid‐phase‐epitaxy films

Anomalous Hall effects, i.e., peaks in the temperature dependence of the Hall coefficient and Hall mobility, have been observed in liquid‐phase‐epitaxy (LPE) Hg0.8 Cd0.2Te films. After establishing that surface effects are not the cause of the anomalies and that our LPE films are indeed n type, we propose an inhomogeneity model with a network of extended p‐type inclusions in an n‐type matrix. Good fits to the experimental data have been obtained by computer simulation based on this model.