Inhomogeneity model for anomalous Hall effects in n-type Hg0.8Cd0.2Te liquid-phase-epitaxy films

Anomalous Hall effects, i.e., peaks in the temperature dependence of the Hall coefficient and Hall mobility, have been observed in liquid-phase-epitaxy (LPE) Hg0.8 Cd0.2Te films. After establishing that surface effects are not the cause of the anomalies and that our LPE films are indeed n type, we propose an inhomogeneity model with a network of extended p-type inclusions in an n-type matrix. Good fits to the experimental data have been obtained by computer simulation based on this model.