比例(比率)
透射电子显微镜
材料科学
结晶学
凝聚态物理
物理
纳米技术
化学
量子力学
作者
Renhui Wang,Yimei Zhu,S. M. Shapiro
标识
DOI:10.1103/physrevlett.80.2370
摘要
To understand the origin of the second long-length scale in $\mathrm{SrTiO}{}_{3}$, we studied structural defects in Verneuil-grown single crystals by transmission electron microscopy. The density of the dislocations was observed to decrease with increasing depth from the original cut surface of the crystals. The high density of dislocations in the skin region is most likely responsible for the second length scale.
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