X射线光电子能谱
基质(水族馆)
纹理(宇宙学)
氯
碘化物
衍射
材料科学
氯化物
薄膜
结晶学
化学工程
原子力显微镜
纳米技术
分析化学(期刊)
化学
无机化学
光学
冶金
计算机科学
有机化学
地质学
物理
图像(数学)
海洋学
人工智能
工程类
作者
Giovanna Pellegrino,Silvia Colella,Ioannis Deretzis,Guglielmo G. Condorelli,Emanuele Smecca,Giuseppe Gigli,Antonino La Magna,Alessandra Alberti
标识
DOI:10.1021/acs.jpcc.5b04496
摘要
In this paper, we use X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy to investigate the structural and morphological properties of methylammonium lead iodide (MAPbI3) thin films deposited on flat TiO2 substrates, as obtained with and without the use of chlorine precursors. We demonstrate that the presence of Cl precursors assists the growth of oriented MAPbI3 domains along a specific growth direction. Such features are attributed to the proximity of the Cl species to the interface with the TiO2 substrate.
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