材料科学
MOSFET
功率(物理)
碳化硅
电气工程
光电子学
电子工程
晶体管
物理
工程类
电压
量子力学
冶金
作者
Yi Jiang,Cancan Li,Liming Che,Yizhuo Dong,Yinjie Mao,Yongtai Lin,Guangyin Lei
出处
期刊:IEEE Transactions on Components, Packaging and Manufacturing Technology
[Institute of Electrical and Electronics Engineers]
日期:2024-11-27
卷期号:15 (7): 1399-1409
被引量:1
标识
DOI:10.1109/tcpmt.2024.3507913
摘要
SiC MOSFETs typically have a small chip area compared to conventional Si IGBTs. The performance of large-area ($10 \times 10$mm) SiC MOSFETs needs to be investigated. In this article, the electrothermal analysis of the large-area SiC MOSFETs is presented compared to regular-sized ($5 \times 5$mm) SiC MOSFETs in paralleling. The result shows that the large-area chips optimize the packaging parameters, mitigate the current imbalance, and have better thermal performance in the double-side cooling (DSC) module compared to the regular-sized chips. A SOT-227 module with large-area chips is manufactured and the electrical performance of the module is tested. The result indicates the better electrical performance of modules using large-area chips. A novel flip-chip DSC module is proposed to take full advantage of the large-area chips. The proposed module is analyzed in terms of electrical and thermal characteristics compared to a conventional DSC module. The parasitic inductance of the proposed module is 5.36 nH for the power circuit and 4.93 nH for the signal loop, which is reduced by 29.1% and 13.7%, respectively. The temperature distribution is improved, and the thermal resistance of the proposed module is 0.268 K/W, which is reduced by 12.0%. The results show that the electrical and thermal performance of the proposed module is better than that of the conventional module.
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