薄膜晶体管
堆栈(抽象数据类型)
光电子学
材料科学
阈值电压
栅极电压
电压
电气工程
计算机科学
晶体管
纳米技术
工程类
图层(电子)
程序设计语言
作者
Dan Liu,Zhonghao Huang,Xu Wu,Yanqiu Li,Yutong Yang,Zhiyong Ning,Taiye Min,Kunkun Gao,Haolan Fang,Liang Fang,Chengjun Qi,Rui Wang
摘要
TFT Vth is affected by gate material, thickness and film structure. If the Al/Mo electrode is added to bottom Mo, or Al is changed to Cu, the work function of Gate increases, that is, the flat band voltage increases, and finally Vth increases. As the gate thickness increases, the gate insulator at the profile position becomes thinner, resulting in a decrease in Vth. MoNb/Cu electrode is covered with top MoNb, which inhibits the diffusion of Cu to gate insulator(GI) and reduces the dielectric loss of GI, so that Vth decreases. At the same time, Cu diffuse to GI layerr, resulting in the positive Vth shift under negative gate stressing. Once MoNb/Cu is covered with top MoNb, the diffusion of Cu ions is inhibited, Vth gradually shifts in the negative direction under negative gate stressing and the positive Vth shift is smaller under positive gate stressing, which indicates that TFT is more stable.
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