Design of DS-CSRR Based Microwave Sensor for Efficient Measurement of Dielectric Constant of Materials

Dual-Slit Complementary Split Rectangular Resonator (DS-CSRR) based microwave sensor is suggested for characterization of dielectric properties of materials under test (MUTs). Microwave sensor is designed and simulated on HFSS. Economical FR4 substrate is used in designing and fabrication of suggested sensor. A deep notch of transmission coefficient (S 21 ) at -32dB is achieved at resonance frequency of 8.56 GHz. Negative electromagnetic properties of electric permittivity ($\varepsilon$) and magnetic permeability ($\mu$) are extracted from magnitude of scattering parameters which are the basic criterion of metamaterials/Left Handed Materials (LHM)/Double Negative Group (DNG). Suggested sensor is fabricated by using photolithography technique. Scattering parameters of fabricate sensor are measured by using VNA (N5224B). A good agreement is shown between the simulated and measured results. Parabolic and transcendental equations are formulated to estimate the resonance frequency and the permittivity of unknown materials through suggested sensor. This method requires only calculating resonant frequency and the magnitude response, thus achieving a substantial reduction in cost, computation time, ease in fabrication and integration with other microwave devices.