Comparative analysis of anti-reflection coatings on solar PV cells through TiO2and SiO2nanoparticles

吸光度 材料科学 带隙 光电子学 光学 折射率 吸收(声学) 涂层 光子能量 光谱学 漫反射 太阳能电池 反射(计算机编程) 光子 纳米技术 物理 复合材料 量子力学 计算机科学 程序设计语言
作者
Rajkamal Sivakumar,Prabhakaran Gopalakrishnan,Abdul Razak Mohamed Sikkander
出处
期刊:Pigment & Resin Technology [Emerald Publishing Limited]
卷期号:51 (2): 171-177 被引量:4
标识
DOI:10.1108/prt-08-2020-0084
摘要

Purpose Photon absorbance and reflectance are the most important parameters for the recombination of electron-hole pairs. Bandgap energy plays a vital role in photon absorption. That is, the photons with energy greater than band gap energy are absorbed. Also, the refractive index of semiconductors is responsible for photon reflection, as the surface with the highest refractive index will reflect more photons than a surface with have a low refractive index. The purpose of this paper is to improvise the absorbance and reduce the reflectance of photons on the front surface of solar cells. Design/methodology/approach Photon reflection is results in reduction in electron-hole pair generation due to the high refractive index of semiconductive materials. To overcome this problem, an Anti-reflection (AR) coating of TiO 2 and SiO 2 is undertaken on solar cells through the Sol-spin coating method. Finally, the effectiveness of the Anti-Reflection coating is scrutinized through UV Vis-Spectroscopy, which provides details regarding reflectance, absorbance and bandgap energy characteristics. Findings UV–visible spectroscopy was used to measure the responses from the samples. The samples responded to the ultraviolet and visible range of electromagnetic radiation perfectly. UV spectroscopy was done before and after the antireflection coating of TiO 2 and SiO 2 over the solar cell to find their corresponding extreme reflectance and absorbance values. The effects of TiO 2 and SiO 2 were evaluated from the results. Originality/value In this research work, the authors have done anti-reflection coating over solar cells with nanoparticles derived from sol-gel process. Absorbance of photons observed through diffuse reflection method.
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