材料科学
光电子学
雪崩光电二极管
光电二极管
光学
APDS
平面的
单光子雪崩二极管
暗电流
光电探测器
雪崩二极管
外延
二极管
击穿电压
响应度
异质结
砷化铟镓
作者
Yiren Chen,Zhiwei Zhang,Guoqing Miao,Hong Jiang,Hang Song
标识
DOI:10.1016/j.matlet.2021.131144
摘要
Abstract In this work, a planar In0.53Ga0.47As/InP avalanche photodiode (APD) working in both front- and back-illumination modes is fabricated for a comparative study. The great differences in the electrical and spectral performances between the two operating approaches can be originated from the PIN junction in the InP cap layer with high electric field, which plays the role of short-wavelength photoelectric conversion before the InP multiplication layer punches through under front-illumination.
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