聚酰亚胺
蚀刻(微加工)
材料科学
微电子机械系统
光电子学
碳化
沉积(地质)
过程(计算)
复合材料
计算机科学
图层(电子)
扫描电子显微镜
古生物学
沉积物
操作系统
生物
作者
Yuwei Kong,Yuanwei Lin,Zihan Dong
标识
DOI:10.1109/cstic52283.2021.9461562
摘要
Polyimide (PI) has been used widely in electronic device manufacture process, such as micro-electro-mechanical systems (MEMS) device and advanced packaging. Due to the limitation of the manufacture process, in general, patterned PI with depth of less than 10 μm is usually adopted in these applications. In this work, a cyclic deposition/etch method is demonstrated, and the patterned PI with depth of more than 30 μm and nearly vertical profile is obtained. Furthermore, the carbonization of PI is avoided by controlling the forward source/bias power and temperature during the etch process. The etch method and structure may be useful in the research and development of some new devices.
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