材料科学
光电探测器
量子点
光电子学
光电二极管
堆积
红外线的
暗电流
带隙
硫化铅
表面工程
量子效率
近红外光谱
光学
纳米技术
锗
比探测率
作者
Qian Chen,Haibo Zhu,Fan Fang,Haodong Tang,Yihan Song,Youming Chen,Lei Rao,Andong Zhong,Yihong Tang,Yi Li,Yi Li,Jiaji Cheng,Junjie Hao,Yiwen Li,Wei Chen,Yiwen Li,Wei Chen
标识
DOI:10.1002/adom.202502078
摘要
Abstract PbS quantum dots (QDs) are promising materials for short‐wave infrared (SWIR) photodetectors due to their tunable bandgap and broad spectral absorption. This study explores the impact of trioctylphosphine (TOP)‐mediated surface reconstruction on PbS QDs, revealing that the TOP treatment enhances QD surface morphology, reduces trap states, and improves QD stacking behavior in solid films. Notably, a diode‐type photodetector based on TOP‐treated QDs exhibits a significantly enhanced specific detectivity ( D *) of 2.07 × 10 11 Jones at 1290 nm, which is 50 times higher than that of devices using conventional QDs. It also shows a marked reduction in dark current density to 237 nA cm −2 at −0.5 V. Furthermore, the TOP‐QD photodetector demonstrates improved storage stability under non‐encapsulated conditions, underscoring the effectiveness of TOP‐mediated surface reconstruction in enhancing both performance and reliability. This work offers valuable insights into the surface engineering of PbS QDs and presents a pathway for the development of high‐performance, solution‐processed SWIR imaging systems and environmental monitoring technologies.
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