小角X射线散射
X射线吸收光谱法
催化作用
材料科学
散射
Atom(片上系统)
纳米技术
化学工程
吸收光谱法
结晶学
化学
计算机科学
物理
光学
有机化学
工程类
嵌入式系统
作者
Lingzhe Fang,Söenke Seifert,Randall E. Winans,Tao Li
标识
DOI:10.1002/smtd.202001194
摘要
Abstract Single‐atom and subnanocluster catalysts (SSCs) represent a highly promising class of low‐cost materials with high catalytic activity and high atom‐utilization efficiency. However, SSCs are susceptible to undergo restructuring during the reactions. Exploring the active sites of catalysts through in situ characterization techniques plays a critical role in studying reaction mechanism and guiding the design of optimum catalysts. In situ X‐ray absorption spectroscopy/small‐angle X‐ray scattering (XAS/SAXS) is promising and widely used for monitoring electronic structure, atomic configuration, and size changes of SSCs during real‐time working conditions. Unfortunately, there is no detailed summary of XAS/SAXS characterization results of SSCs. The recent advances in applying in situ XAS/SAXS to SSCs are thoroughly summarized in this review, including the atomic structure and oxidation state variations under open circuit and realistic reaction conditions. Furthermore, the reversible transformation of single‐atom catalysts (SACs) to subnanoclusters/nanoparticles and the application of in situ XAS/SAXS in subnanoclusters are discussed. Finally, the outlooks in modulating the SSCs and developing operando XAS/SAXS for SSCs are highlighted.
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