扩展X射线吸收精细结构
铈
价(化学)
X射线吸收光谱法
氧化铈
氧烷
氧化态
催化作用
K-边
谱线
化学
吸收光谱法
电子结构
材料科学
物理化学
无机化学
物理
计算化学
光学
有机化学
生物化学
天文
作者
Emiliano Fonda,D. Andreatta,Paula E. Colavita,G. Vlaic
标识
DOI:10.1107/s0909049598010280
摘要
Cerium oxide (IV) (CeO2) is extensively employed in heterogeneous catalysis, particularly as a promoter of noble metal action in three-way catalysts. For this reason there is a great scientific and economical interest in the development of any possible chemical or structural analysis technique that could provide information on these systems. EXAFS spectroscopy has revealed itself as a powerful technique for structural characterization of such catalysts. Unfortunately, good quality K-edge spectra of cerium are not yet easily obtainable because of the high photon energy required (>40 keV). On the other hand, at lower energies it is easy to collect very good spectra of the L3 edge (5.5 keV), but L3-edge spectra of cerium (IV) are characterized by the presence of two undesired additional phenomena that interfere with EXAFS analysis: final-state mixed-valence behaviour and intense multi-electron excitations. Here, a comparative analysis of the K, L3, L2 and L1 edges of Ce in CeO2 has been made and a procedure for obtaining structural parameters from L3-edge EXAFS, even in the presence of these features, has been developed. This procedure could allow further studies of catalytic compounds containing tetravalent cerium surrounded by oxygen ligands.
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