开尔文探针力显微镜
扫描电化学显微镜
腐蚀
伏打电位
显微镜
扫描探针显微镜
化学
材料科学
电化学
生物物理学
化学物理
纳米技术
原子力显微镜
电极
冶金
物理化学
光学
物理
生物
作者
Ceylan Senöz,Artjom Maljusch,Michael Rohwerder,Wolfgang Schuhmann
标识
DOI:10.1002/elan.201100609
摘要
Scanning Kelvin Probe Force Microscopy and Scanning Electrochemical Microscopy were applied for the investigation of localized corrosion on heterogeneous aiming on the investigation of the possible correlation between the local surface potential differences, measured by the Kelvin probe technique in ambient conditions, and corrosion during immersion in a corrosive electrolyte. A model sample mimicking the interaction of Al and Cu in Al alloys was chosen to demonstrate the complementary nature of the information received from SKPFM and SECM. The necessary prerequisites for a future integration of SKP and SECM into a single set-up are discussed.
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